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[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - Room temperature 0.1 μm CMOS technology with 11.8 ps gate delay
Lee, K.F., Yan, R.H., Jeon, D.Y., Chin, G.M., Kim, Y.O., Tennant, D.M., Razavi, B., Lin, H.D., Wey, Y.G., Westerwick, E.H., Morris, M.D., Johnson, R.W., Liu, T.M., Tarsia, M., Cerullo, M., Swartz, R.GYear:
1993
Language:
english
DOI:
10.1109/iedm.1993.347382
File:
PDF, 295 KB
english, 1993