Detailed analysis of scanning tunneling microscopy images...

Physical Review B 2001 / 5 Vol. 63; Iss. 19

Detailed analysis of scanning tunneling microscopy images of the Si(001) reconstructed surface with buckled dimers

Okada, Hiromi, Fujimoto, Yoshitaka, Endo, Katsuyoshi, Hirose, Kikuji, Mori, Yuzo
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Volume:
63
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.63.195324
Date:
May, 2001
File:
PDF, 406 KB
english, 2001
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