Nonvolatile memory characteristics of atomic layer deposited Ru nanocrystals with a SiO[sub 2]/Al[sub 2]O[sub 3] bilayered tunnel barrier
Lee, Do-Joong, Yim, Sung-Soo, Kim, Ki-Su, Kim, Soo-Hyun, Kim, Ki-BumVolume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3275346
File:
PDF, 579 KB
english, 2010