Reflection high‐energy electron diffraction intensity...

Reflection high‐energy electron diffraction intensity monitored homoepitaxial growth of SrTiO3 buffer layer by pulsed laser deposition

Chern, M. Y., Gupta, A., Hussey, B. W., Shaw, T. M.
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Volume:
11
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.578784
Date:
May, 1993
File:
PDF, 656 KB
english, 1993
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