[IEEE 2011 International Conference on Computer, Communication and Electrical Technology (ICCCET) - Tirunelveli, Tamil Nadu, India (2011.03.18-2011.03.19)] 2011 International Conference on Computer, Communication and Electrical Technology (ICCCET) - Device level analysis of threshold voltage variation in FinFET with varied design parameters
Jackuline Moni, D., Malarkodi, R., Suresh, B.Year:
2011
Language:
english
DOI:
10.1109/icccet.2011.5762478
File:
PDF, 221 KB
english, 2011