High-resolution transmission electron microscopy of cubic Si[sub 3]N[sub 4]
Zhang, Ming, He, Hongliang, Xu, F. F., Sekine, T., Kobayashi, T., Bando, Y.Volume:
88
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1287765
File:
PDF, 932 KB
english, 2000