Dopant penetration studies through Hf silicate
Quevedo-Lopez, M. A., Visokay, M. R., Chambers, J. J., Bevan, M. J., LiFatou, A., Colombo, L., Kim, M. J., Gnade, B. E., Wallace, R. M.Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1846138
File:
PDF, 1.31 MB
english, 2005