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Experimental evidence for exchange bias in polycrystalline BiFeO3/Ni81Fe19 thin films
Hauguel, Tony, Pogossian, Souren P., Dekadjevi, David T., Spenato, David, Jay, Jean-Philippe, Indenbom, Mikhail V., Youssef, Jamal BenVolume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3636098
File:
PDF, 1.23 MB
english, 2011