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[IEEE 2008 66th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2008.06.23-2008.06.25)] 2008 Device Research Conference - Read Disturb in NROM Charge Trapping Non-Volatile Memory Device
Shainsky, Natalie, Bloom, Ilan, Shacham, Yosi, Eitan, BoazYear:
2008
Language:
english
DOI:
10.1109/drc.2008.4800837
File:
PDF, 2.28 MB
english, 2008