Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC
Schwarz, U. T., Schuck, P. J., Mason, M. D., Grober, R. D., Roskowski, A. M., Einfeldt, S., Davis, R. F.Volume:
67
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.67.045321
Date:
January, 2003
File:
PDF, 285 KB
english, 2003