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A comparative study of electronic and structural properties of polycrystalline and epitaxial magnetron-sputtered ZnO:Al and Zn1-xMgxO:Al Films—Origin of the grain barrier traps
Bikowski, André, Ellmer, KlausVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4817376
File:
PDF, 1.50 MB
english, 2013