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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits
Regazzoni, Francesco, Eisenbarth, Thomas, Grobschadl, Johann, Breveglieri, Luca, Ienne, Paolo, Koren, Israel, Paar, ChristofYear:
2007
Language:
english
DOI:
10.1109/dft.2007.61
File:
PDF, 224 KB
english, 2007