[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - A design for reliability methodology based on selective overdesign
Askari, Syed, Nourani, MehrdadYear:
2010
Language:
english
DOI:
10.1109/idt.2010.5724411
File:
PDF, 1003 KB
english, 2010