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Doping characterization of InAs∕GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy
Z. Y. Zhao, W. M. Zhang, C. Yi, A. D. Stiff-roberts, B. J. Rodriguez, A. P. BaddorfYear:
2008
Language:
english
DOI:
10.1063/1.2889938
File:
PDF, 414 KB
english, 2008