Triple-crystal x-ray diffraction analysis of reactive ion...

Triple-crystal x-ray diffraction analysis of reactive ion etched gallium arsenide

Wang, V. S., Matyi, R. J., Nordheden, K. J.
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Volume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356062
File:
PDF, 1.15 MB
english, 1994
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