Design and component test of SFQ shift register memories
Fujiwara, K., Hoshina, H., Yamashiro, Y., Yoshikawa, N.Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.813945
Date:
June, 2003
File:
PDF, 739 KB
english, 2003