![](/img/cover-not-exists.png)
[IEEE 2005 6th International Conference on ASIC - Shanghai, China (24-27 Oct. 2005)] 2005 6th International Conference on ASIC - Experimental Studies on SAT-Based Test Pattern Generation for Industrial Circuits
Junhao Shi,, Fey, G., Drechsler, R., Glowatz, A., Schloffel, J., Hapke, F.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/icasic.2005.1611489
File:
PDF, 838 KB
english, 2005