[IEEE 2005 6th International Conference on ASIC - Shanghai,...

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[IEEE 2005 6th International Conference on ASIC - Shanghai, China (24-27 Oct. 2005)] 2005 6th International Conference on ASIC - Experimental Studies on SAT-Based Test Pattern Generation for Industrial Circuits

Junhao Shi,, Fey, G., Drechsler, R., Glowatz, A., Schloffel, J., Hapke, F.
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Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/icasic.2005.1611489
File:
PDF, 838 KB
english, 2005
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