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[IEEE International Symposium on Electromagnetic Compatibility - Beijing, China (21-24 May 2002)] 2002 3rd International Symposium on Electromagnetic Compatibility - The use of an optically modulated scatterer to measure the performance of microwave electromagnetic wave absorber
Wenlie Liang,, Alexander, M., Clarke, B., Pharaoh, K.Year:
2002
Language:
english
DOI:
10.1109/elmagc.2002.1177456
File:
PDF, 326 KB
english, 2002