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Low-energy electron diffraction study of the multilayer relaxation of Cu(211)
Seyller, Th., Diehl, R. D., Jona, F.Volume:
17
Year:
1999
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.581864
File:
PDF, 428 KB
english, 1999