[IEEE 2008 IEEE Symposium on Visual Analytics Science and...

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[IEEE 2008 IEEE Symposium on Visual Analytics Science and Technology (VAST) - Columbus, OH, USA (2008.10.19-2008.10.24)] 2008 IEEE Symposium on Visual Analytics Science and Technology - The Scalable Reasoning System: Lightweight visualization for distributed analytics

Pike, William A., Bruce, Joe, Baddeley, Bob, Best, Daniel, Franklin, Lyndsey, May, Richard, Rice, Douglas M., Riensche, Rick, Younkin, Katarina
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Year:
2008
Language:
english
DOI:
10.1109/vast.2008.4677366
File:
PDF, 629 KB
english, 2008
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