High-precision measurements in few-electron highly charged...

Canadian Journal of Physics 2005 / 04 Vol. 83; Iss. 4

High-precision measurements in few-electron highly charged ions at the HeidelbergElectron Beam Ion Trap (EBIT)

López-Urrutia, J.R. Crespo, Braun, J, Brenner, G, Bruhns, H, Draganič, I N, Martínez, AJ González, Lapierre, A, Mironov, V, Osborne, C, Sikler, G, Orts, R Soria, Tawara, H, Ullrich, J, Tupitsyn, I I,
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Volume:
83
Journal:
Canadian Journal of Physics
DOI:
10.1139/p05-015
Date:
April, 2005
File:
PDF, 281 KB
2005
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