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[IEEE 2006 SICE-ICASE International Joint Conference - Busan Exhibition & Convention Center-BEXCO, Busan, Korea (2006.10.18-2006.10.21)] 2006 SICE-ICASE International Joint Conference - Object Recognition using Simultaneous Pattern-Matching in Virtual Environment
Takahashi, Yusuke, Muramatu, Yuta, Kato, KiyotakaYear:
2006
Language:
english
DOI:
10.1109/sice.2006.315780
File:
PDF, 4.86 MB
english, 2006