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Debris mitigation in pinhole-apertured point-projection backlit imaging
Blue, B. E., Hansen, J. F., Tobin, M. T., Eder, D. C., Robey, H. F.Volume:
75
Year:
2004
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1809288
File:
PDF, 526 KB
english, 2004