Measuring the three-photon self-annihilation fraction of positronium in and above thin films: A tool for determining film morphology
Townrow, S., Coleman, P. G.Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4825371
File:
PDF, 1.19 MB
english, 2013