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[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Modeling connector contact condition using a contact failure model with equivalent inductance
Hayashi, Yu-ichi, Songping Wu,, Jun Fan,, Mizuki, T, Sone, HYear:
2010
Language:
english
DOI:
10.1109/isemc.2010.5711371
File:
PDF, 518 KB
english, 2010