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[IEEE 2011 IEEE International Conference on Electro/Information Technology (EIT 2011) - Mankato, MN, USA (2011.05.15-2011.05.17)] 2011 IEEE INTERNATIONAL CONFERENCE ON ELECTRO/INFORMATION TECHNOLOGY - Rated power increment and VSWR characteristics improvement of termination resistor
Rahman, Akhlaq, Olinger, Fred, Howieson, MichaelYear:
2011
Language:
english
DOI:
10.1109/eit.2011.5978598
File:
PDF, 775 KB
english, 2011