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: An application of the analysis of extended x-ray-absorption fine structure in anharmonic systems
Mustre de Leon, J., Conradson, S. D., Batistić, I., Bishop, A. R., Raistrick, I. D., Aronson, M. C., Garzon, F. H.Volume:
45
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.45.2447
Date:
February, 1992
File:
PDF, 564 KB
english, 1992