In situ imaging of ultra-fast loss of nanostructure in...

In situ imaging of ultra-fast loss of nanostructure in nanoparticle aggregates

Egan, Garth C., Sullivan, Kyle T., LaGrange, Thomas, Reed, Bryan W., Zachariah, Michael R.
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Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4867116
Date:
February, 2014
File:
PDF, 1.43 MB
english, 2014
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