Reliability of SiGe HBTs for Power Amplifiers—Part I: Large-Signal RF Performance and Operating Limits
Grens, C.M., Peng Cheng,, Cressler, J.D.Volume:
9
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2009.2025029
Date:
September, 2009
File:
PDF, 972 KB
english, 2009