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[IEEE 2011 3rd Asia Symposium on Quality Electronic Design (ASQED 2011) - Kuala Lumpur, Malaysia (2011.07.19-2011.07.20)] 2011 3rd Asia Symposium on Quality Electronic Design (ASQED) - Finding the worst case supply noise excitation methodology for high speed I/O interfaces
Tan, Fern Nee, Lee, Sheng Chyan, Faidz, Abd RahmanYear:
2011
Language:
english
DOI:
10.1109/asqed.2011.6111739
File:
PDF, 3.15 MB
english, 2011