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Temperature-induced voltage drop rearrangement and its effect on oxide breakdown in metal-oxide-semiconductor capacitor structure
Wang, Tsung-Miau, Hwu, Jenn-GwoVolume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1850199
File:
PDF, 360 KB
english, 2005