Lifetime-degrading boron-oxygen centres in p-type and n-type compensated silicon
Voronkov, V. V., Falster, R., Bothe, K., Lim, B., Schmidt, J.Volume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3609069
File:
PDF, 762 KB
english, 2011