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Correlation between hole carrier densities and a Raman spectrum in polycrystalline silicon doped with boron
Nakano, Noboru, Marville, Louis, Reif, RafaelVolume:
72
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.351621
File:
PDF, 681 KB
english, 1992