STEM Electron Tomography for Nanoscale Materials Science

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S02

STEM Electron Tomography for Nanoscale Materials Science

Midgley, Paul Anthony, Weyland, Matthew, Yates, Tim, Tong, Jenna, Dunin-Borkowski, Rafal E, Thomas, John Meurig
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192760488125X
Date:
August, 2004
File:
PDF, 325 KB
english, 2004
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