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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Numerical simulation of DB-NBTI degradation caused by a sheet of interface charge
Huang, Si-Wen, He, Wei, Zhao, Xiao-Jin, Cao, Jian-MinYear:
2012
Language:
english
DOI:
10.1109/icsict.2012.6466736
File:
PDF, 311 KB
english, 2012