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[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - New DfT architectures for 3D-SICs with a wireless test port
Yibo He,, Xiaole Cui,, Chung-Len Lee,, Xiaoxin Cui,, Yufeng Jin,Year:
2013
Language:
english
DOI:
10.1109/asicon.2013.6812017
File:
PDF, 429 KB
english, 2013