Direct determination of exact charge states of surface...

Physical Review B 1996 / 3 Vol. 53; Iss. 11

Direct determination of exact charge states of surface point defects using scanning tunneling microscopy: As vacancies on GaAs (110)

Chao, Kuo-Jen, Smith, Arthur R., Shih, Chih-Kang
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Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.53.6935
Date:
March, 1996
File:
PDF, 273 KB
english, 1996
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