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Structural and dielectric characterization of the (Ba[sub 1−x]Sr[sub x])(Ti[sub 0.9]Sn[sub 0.1])O[sub 3] thin films deposited on Pt/Ti/SiO[sub 2]/Si substrate by radio frequency magnetron sputtering
Wang, Moo-Chin, Tsai, Cheng-Chi, Wu, Nan-Chung, Hung, Kun-MingVolume:
92
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1492002
File:
PDF, 799 KB
english, 2002