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Release path temperatures of shock-compressed tin from dynamic reflectance and radiance measurements
La Lone, B. M., Stevens, G. D., Turley, W. D., Holtkamp, D. B., Iverson, A. J., Hixson, R. S., Veeser, L. R.Volume:
114
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4817764
Date:
August, 2013
File:
PDF, 3.30 MB
english, 2013