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Annealing neutron damaged silicon bipolar transistors: Relating gain degradation to specific lattice defects
Fleming, R. M., Seager, C. H., Lang, D. V., Campbell, J. M.Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3480798
File:
PDF, 455 KB
english, 2010