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Coulomb scattering in high-κ gate stack silicon-on-insulator metal-oxide-semiconductor field effect transistors
Jiménez-Molinos, F., Gámiz, F., Donetti, L.Volume:
104
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2975993
File:
PDF, 716 KB
english, 2008