A multipoint correlation method for bulk trap and interface state measurements in MOS structures from capacitance, voltage, and current transients
Dmowski, K., Bethge, K., Maurer, Ch.Volume:
62
Year:
1991
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1142399
File:
PDF, 1.17 MB
english, 1991