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Bonding at the K/Si(100) 2×1 interface: A surface extended x-ray-absorption fine-structure study
Kendelewicz, T., Soukiassian, P., List, R. S., Woicik, J. C., Pianetta, P., Lindau, I., Spicer, W. E.Volume:
37
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.37.7115
Date:
April, 1988
File:
PDF, 363 KB
english, 1988