Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2010 Vol. 28; Iss. 6
Defect-free etching process for GaAs/AlGaAs hetero-nanostructure using chlorine/argon mixed neutral beam
Wang, Xuan-Yu, Huang, Chi-Hsien, Ohno, Yuzo, Igarashi, Mokoto, Murayama, Akihiro, Samukawa, SeijiVolume:
28
Year:
2010
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3499716
File:
PDF, 751 KB
english, 2010