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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - Analysis of Effects of Dielectric and Material Characteristics on the Performance of Thick Film Thermistors Using Commercial Software Tools
Maric, Viktor, Lukovic, Miloljub, Zivanov, Ljiljana, Aleksic, ObradYear:
2006
Language:
english
DOI:
10.1109/imtc.2006.328534
File:
PDF, 214 KB
english, 2006