The Nature of the Deep Hole Trap in MOS Oxides

IEEE Transactions on Nuclear Science 1987 Vol. 34; Iss. 6

The Nature of the Deep Hole Trap in MOS Oxides

Witham, Howard S., Lenahan, Patrick M.
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Volume:
34
Year:
1987
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.1987.4337444
File:
PDF, 674 KB
english, 1987
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