Materials and electrical characterization of molecular beam deposited CeO[sub 2] and CeO[sub 2]/HfO[sub 2] bilayers on germanium
Brunco, D. P., Dimoulas, A., Boukos, N., Houssa, M., Conard, T., Martens, K., Zhao, C., Bellenger, F., Caymax, M., Meuris, M., Heyns, M. M.Volume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2756519
File:
PDF, 1.02 MB
english, 2007