Grain Deformation and Strain in Board Level SnAgCu Solder Interconnects Under Deep Thermal Cycling
Park, Seungbae, Dhakal, Ramji, Lehman, Lawrence, Cotts, Eric J.Volume:
30
Language:
english
Journal:
IEEE Transactions on Components and Packaging Technologies
DOI:
10.1109/tcapt.2007.892101
Date:
March, 2007
File:
PDF, 1.65 MB
english, 2007