[IEEE 2010 12th Biennial Baltic Electronics Conference (BEC2010) - Tallinn, Estonia (2010.10.4-2010.10.6)] 2010 12th Biennial Baltic Electronics Conference - Macro level defect-oriented diagnosability of digital circuits
Kostin, Sergei, Ubar, Raimund, Raik, JaanYear:
2010
Language:
english
DOI:
10.1109/bec.2010.5629723
File:
PDF, 102 KB
english, 2010