[IEEE 2006 40th Annual Conference on Information Sciences and Systems - Princeton, NJ, USA (2006.03.22-2006.03.24)] 2006 40th Annual Conference on Information Sciences and Systems - Practical Darknet Measurement
Bailey, Michael, Cooke, Evan, Jahanian, Farnam, Myrick, Andrew, Sinha, SushantYear:
2006
Language:
english
DOI:
10.1109/ciss.2006.286376
File:
PDF, 344 KB
english, 2006